STP Published: 1974
STP572-EB

Semiconductor Measurement Technology: Spreading Resistance Symposium

Editor(s): J. Ehrstein

Table of Contents

Judson C. French

Robert I. Scace

Robert G. Mazur

Stephen J. Fonash

P. J. Severin

D. H. Dickey

P. M. Pinchon

B. L. Morris, P. H. Langer, J. C. White

Gregg A. Lee

James C. White

P. J. Severin

J. Krausse

A. Mayer, S. Shwartzman

H. Murrmann, F. Sedlak

H. J. Ruiz, F. W. Voltmer

Walter H. Schroen, Gregg A. Lee, Fred W. Voltmer

J. L. Deines, E. F. Gorey, A. E. Michel, M. R. Poponiak

J. R. Edwards, H. E. Nigh

Fritz G. Vieweg-Gutberlet

F. W. Voltmer, H. J. Ruiz

Jacques Assour

Gilbert A. Gruber, Robert F. Pfeifer

H. Murrmann, F. Sedlak

N. Goldsmith, R. V. D'Aiello, R. A. Sunshine

Walter H. Schroen

J. R. Ehrstein

Paul Langer

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Details
Developed by Committee: F01
Pages: 288
DOI: 10.1520/STP572-EB
ISBN-EB: 978-0-8031-6938-8
ISBN-13: 978-0-8031-6661-5