SYMPOSIA PAPER Published: 01 January 1994

Intercomparison of Neutron Test Facilities for Equivalent Damage to Electronics


Neutron-sensitive diodes are practical monitors for comparing damage delivered to electronic devices among different test facilities. Heat treatment of the diodes before readout is shown to eliminate effects of temperature variations between exposure and readout. This allows the comparisons to be done on a mail-in basis. The results of such a comparison among several neutron facilities is presented.

Author Information

Heimbach, CR
Combat Systems Test Activity, STECS-NE, MD
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Developed by Committee: E10
Pages: 509–514
DOI: 10.1520/STP15146S
ISBN-EB: 978-0-8031-5281-6
ISBN-13: 978-0-8031-1899-7