SYMPOSIA PAPER Published: 01 January 1985

A Low-Cost Microprocessor-Based Data Acquisition and Control System for Fatigue Crack Growth Testing


The requirements for obtaining economic fatigue crack growth data from the threshold regime to instability in inert, gaseous, elevated-temperature, and aqueous environments necessitate the development of remote crack growth monitoring techniques. Two of these processes used extensively are the compliance method and the potential-drop method.

The performance of a microprocessor-based machine controller and data acquisition system utilizing the d-c potential-drop method of monitoring crack length is presented. The development of software for performing K-increasing and threshold tests and their compliance with the present ASTM standards are discussed. The successful development and use of the machine are shown by the results obtained during round-the-clock testing for acquiring crack growth data for a titanium alloy.

Author Information

Sooley, PM
University of Toronto, Toronto, Ont.
Hoeppner, DW
University of Toronto, Toronto, Ont.
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Developed by Committee: E08
Pages: 101–117
DOI: 10.1520/STP32882S
ISBN-EB: 978-0-8031-4942-7
ISBN-13: 978-0-8031-0421-1