Standard Historical Last Updated: May 07, 2024 Track Document
ASTM E1894-18

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources

Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources E1894-18 ASTM|E1894-18|en-US Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources Standard new BOS Vol. 12.02 Committee E10
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Significance and Use

4.1 Flash X-ray facilities provide intense bremsstrahlung radiation environments, usually in a single sub-microsecond pulse, which often fluctuates in amplitude, shape, and spectrum from shot to shot. Therefore, appropriate dosimetry must be fielded on every exposure to characterize the environment, see ICRU Report 34. These intense bremsstrahlung sources have a variety of applications which include the following:

4.1.1 Studies of the effects of X-rays and gamma rays on materials.

4.1.2 Studies of the effects of radiation on electronic devices such as transistors, diodes, and capacitors.

4.1.3 Computer code validation studies.

4.2 This guide is written to assist the experimenter in selecting the needed dosimetry systems for use at pulsed X-ray facilities. This guide also provides a brief summary of the information on how to use each of the dosimetry systems. Other guides (see Section 2) provide more detailed information on selected dosimetry systems in radiation environments and should be consulted after an initial decision is made on the appropriate dosimetry system to use. There are many key parameters which describe a flash X-ray source, such as dose, dose rate, spectrum, pulse width, etc., such that typically no single dosimetry system can measure all the parameters simultaneously. However, it is frequently the case that not all key parameters must be measured in a given experiment.


1.1 This guide provides assistance in selecting and using dosimetry systems in flash X-ray experiments. Both dose and dose-rate techniques are described.

1.2 Operating characteristics of flash X-ray sources are given, with emphasis on the spectrum of the photon output.

1.3 Assistance is provided to relate the measured dose to the response of a device under test (DUT). The device is assumed to be a semiconductor electronic part or system.

1.4 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.

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Book of Standards Volume: 12.02
Developed by Subcommittee: E10.07
Pages: 19
DOI: 10.1520/E1894-18
ICS Code: 17.240