Published: 01 January 1989
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Cite this document
The results of an investigation are presented which compare the effectiveness of various data acquisition methods for automated single specimen JIC testing. Also discussed are the resolution requirements for obtaining acceptable elastic compliance unload data with 12-bit, 14-bit, and 16-bit analog-to-digital converters (A/Ds) and the use of high-gain window amplifiers.
The results of this investigation indicated that: 1. The system noise has a performance-limiting effect on high-resolution A/D converters. 2. More consistent results were obtained by amplifying the analog signals prior to digitizing than by directly digitizing the signals from high-resolution (16-bit) A/Ds. 3. The number of data pairs used to determine the compliance measured crack length has only a minor effect on the calculated crack length. 4. JIC test results may be adversely affected by using low-resolution data acquisition systems.
resolution, J, IC, testing, compliance, system noise
Senior software engineer, MTS Systems Corp., Minneapolis, MN