Published: Jan 1950

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    During recent years many types of new equipment and corresponding new techniques have been developed for making and interpreting dynamic measurements. Most of these developments have involved electrical or electronic devices and a field of specialization generally unfamiliar to engineers concerned with research upon, and investigation of, materials and structures. Investigation of dynamic conditions has become increasingly important. No single source of information has been available that presented the scope, applicability, possibilities and limitations of electronic measuring and recording devices. The present group of four papers has been prepared to assist the individual who may be responsible for initiating such tests, or who may have to make practical application of the results of such tests. The general title “Dynamic Stress Determinations” was a compromise and has been interpreted to include the phenomena associated with the dynamic state which would be of principal interest to engineers in the field of materials and structures. In most cases this may be stress, but since this is a “determined” quantity and is indirectly obtained from measured strains, deflections, displacements, velocities, accelerations, etc., specific attention is directed toward such related quantities. The computation of stresses from the quantities measured is not considered here, that being the process generally most familiar to testing engineers. The subject is more limited than that of “dynamic testing” which is a general term including not only the recording and interpretation of dynamic phenomena but also the control of the load variable and the validity of such tests. The principles involved in the measuring and recording system for any dynamic condition are in general similar, the resulting simplicity or complexity being governed by correct knowledge of the factors involved and the type of end results desired.

    Author Information:

    Eberhart, Howard D.
    Professor of Civil EngineeringChairman of Symposium Committee, University of California, Berkeley, Calif.

    Committee/Subcommittee: E28.13

    DOI: 10.1520/STP47672S

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