Work Item
ASTM WK87792

Revision of F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

Rationale

Normal review cycle.

Details

Developed by Subcommittee: E10.07

Committee: E10

Staff Manager: Stephen Mawn

Work Item Status

Date Initiated: 09-09-2023

Technical Contact: Patrick Griffin