Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe

    Volume 9, Issue 3 (May 1981)

    ISSN: 0090-3973

    CODEN: JTEOAD

    Page Count: 4


    Keusseyan, RL
    Graduate student and professormember of ASTM, Cornell University, Bard Hall, Ithaca, N.Y.

    Li, C-Y
    Graduate student and professormember of ASTM, Cornell University, Bard Hall, Ithaca, N.Y.

    Abstract

    A new type of capacitance displacement measuring system has been developed. The gage is directly attached to the specimen for measurements at elevated temperatures. This system has been successfully used in materials testing at temperatures up to 600°C with excellent repeatability and resolution in strain in the 10−6 range. Good temperature stability of the entire system is required to achieve the reported capabilities.


    Paper ID: JTE11559J

    DOI: 10.1520/JTE11559J

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    Author
    Title Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe
    Symposium , 0000-00-00
    Committee E08