Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe

Volume 9, Issue 3 (May 1981)

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ISSN: 1945-7553
CODEN: JTEVAB
Page Count: 4

Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe

Keusseyan, RL
Graduate student and professormember of ASTM, Cornell University, Bard Hall, Ithaca, N.Y.

Li, C-Y
Graduate student and professormember of ASTM, Cornell University, Bard Hall, Ithaca, N.Y.

Abstract

A new type of capacitance displacement measuring system has been developed. The gage is directly attached to the specimen for measurements at elevated temperatures. This system has been successfully used in materials testing at temperatures up to 600°C with excellent repeatability and resolution in strain in the 10⁻⁶ range. Good temperature stability of the entire system is required to achieve the reported capabilities.

Keywords:
tension tests, high temperature tests, strain measurement

Paper ID: JTE11559J
DOI: 10.1520/JTE11559J
ASTM International is a member of CrossRef.

Author Title Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe Symposium , 0000-00-00 Committee E08

		SEDL / Journals / Journal of Testing and Evaluation (JTE) / Citation Page Volume 9, Issue 3 (May 1981) Click here to download this paper now for $25 PDF (148K) View License Agreement ISSN: 1945-7553 CODEN: JTEVAB Page Count: 4 Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe Keusseyan, RL Graduate student and professormember of ASTM, Cornell University, Bard Hall, Ithaca, N.Y. Li, C-Y Graduate student and professormember of ASTM, Cornell University, Bard Hall, Ithaca, N.Y. Abstract A new type of capacitance displacement measuring system has been developed. The gage is directly attached to the specimen for measurements at elevated temperatures. This system has been successfully used in materials testing at temperatures up to 600°C with excellent repeatability and resolution in strain in the 10⁻⁶ range. Good temperature stability of the entire system is required to achieve the reported capabilities. Keywords: tension tests, high temperature tests, strain measurement Paper ID: JTE11559J DOI: 10.1520/JTE11559J ASTM International is a member of CrossRef. Author Title Precision Strain Measurement at Elevated Temperatures Using a Capacitance Probe Symposium , 0000-00-00 Committee E08