Volume 19, Issue 3 (July 1974)

    Evaluation of SEM Potential in the Examination of Shotgun and Rifle Firing Pin Impressions

    (Received 8 February 1973; accepted 5 November 1973)

    Published Online: July

    CODEN: JFSOAD

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    Abstract

    Recently the scanning electron microscope (SEM) was successfully used for an indepth study of firing pin impressions of semiautomatic pistols [1]. The SEM's great depth of field was shown to reveal detail in the impression (far superior to optical microscopy) which could be successfully used for comparison purposes. It was thus the intent of this investigation to extend the work on pistols to shotguns and rifles, in order to see if their firing pin impressions possessed similar class characteristics and identifying features with repeated firings. In addition to this, the effect of preexisting primer marks on the resulting firing pin impression was also studied.


    Author Information:

    Grove, CA
    Engineer, Knolls Atomic Power Laboratory, Schenectady, N.Y.

    Judd, G
    Associate professor, Rensselaer Polytechnic Institute, Troy, N.Y.

    Horn, R
    Senior firearms examiner, New York State Police Scientific Laboratory, Albany, N.Y.


    Stock #: JFS10200J

    ISSN: 0022-1198

    DOI: 10.1520/JFS10200J

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    Author
    Title Evaluation of SEM Potential in the Examination of Shotgun and Rifle Firing Pin Impressions
    Symposium , 0000-00-00
    Committee E30