Dr. Clifford Bueno, senior scientist at GE Global Research Center in Niskayuna, N.Y., has received the ASTM International Committee Charles W. Briggs Award from ASTM Committee E07 on Nondestructive Testing in recognition of his continuous and outstanding contributions to the work of the committee. The Briggs award is E07’s highest committee award.

Bueno has been a member of ASTM International and Committee E07 since 2001. He has served as a section chairman for non-film radiology within Subcommittee E07.01 on Radiology (X and Gamma) Method, and has contributed to the development of several new and revised E07 standards. The committee has recognized his work with four certificates of appreciation.

A graduate of York College, a senior college of the City University of New York, Jamaica, N.Y., where he earned a bachelor’s degree in chemistry, Bueno received his Ph.D. in chemistry from the State University of New York, Buffalo, N.Y., in 1982. After completing his Ph.D., he worked as a postdoctoral fellow at the Pittsburgh Energy Technology Center in Pittsburgh, Pa, from 1982 to 1984. He then held scientist positions at GTE Sylvania in Towanda, Pa., and Lockheed Martin Research Labs in Palo Alto, Calif., before assuming his role at GE in 1997.

Bueno’s work focuses on the design of digital x-ray imaging systems to perform radiography and computed tomography for industrial inspection and homeland security applications. In addition to ASTM International, he is a member of the American Society for Nondestructive Testing.

ASTM PR Contact: Erin K. Brennan, Phone: 610-832-9602; ebrennan@astm.org

Release #8798

Feb 18, 2011