Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices
Matching Standards Under the Jurisdiction of E10.07 by Status
- E668-20 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
- -See also WK89437 proposed Revision
- E1855-20 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
- -See also WK93455 proposed Revision
- E265-15(2020) Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
- -See also WK89438 proposed Revision
- E496-14(2022) Standard Test Method for Measuring Neutron Fluence and Average Energy from 3H(d,n)4He Neutron Generators by Radioactivation Techniques
- E666-21 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
- E720-23 Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
- E721-22 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
- E722-19 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
- -See also WK94647 proposed Reapproval
- E798-24 Standard Practice for Conducting Irradiations at Accelerator-Based Neutron Sources
- E1249-15(2021) Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
- -See also WK95696 proposed Revision
- E1250-15(2020) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
- E1854-19 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
- -See also WK86445 proposed Revision
- E1894-24 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
- E2450-23 Standard Practice for Application of CaF
2 (Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments - E3084-17(2022)e1 Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
- F448-18 Standard Test Method for Measuring Steady-State Primary Photocurrent
- -See also WK87917 proposed Revision
- F526-21 Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
- F980-16(2024) Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
- -See also WK87790 proposed Revision
- F1190-24 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
- F1192-24 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
- F1263-25 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
- -See also WK91442 proposed Revision
- F1467-25 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
- -See also WK87918 proposed Revision
- F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
- -See also WK93582 proposed Revision
- WK59267 Use of 2N1486 Silicon Bipolar Junction Transistors as Neutron Spectrum Sensors and 1-MeV(Si) Fluence Monitors
- E665-94 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
- E763-91 Practice for Calculation of Absorbed Dose From Neutron Irradiation by Application of Threshold-Foil Measurement Data (Withdrawn 1997)
- E1027-92 Practice for Exposure of Polymeric Materials to Ionizing Radiation (Withdrawn 1996)