Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices | ASTM

Using Artificial Intelligence (AI) on ASTM standards and related intellectual property is prohibited. Violations will result in suspension of access.

Home
FAQ

Home
FAQ

Home
Membership & Participati…

/

Technical Committees

/

Subcommittee E10.07 on R…

Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices

Loading...

About ASTM

Governance Global Cooperation Corporate Citizenship History Regional Offices and Websites Diversity, Equity, Inclusion & Belonging Culture & Careers

Membership & Participation

Membership Technical Committees Member Tools Meetings, Symposia & Workshops Academic Outreach Emerging Professionals Publish with ASTM Consumer Participation

Standards & Solutions

Standards & Publications Enterprise Solutions ASTM Compass®Digital Library Market Insights & Innovation Laboratory Services Training Courses Certification Cement & Concrete Reference Lab

News

Standardization News Press Releases Podcasts Español Editorial Calendar and Media Kit

Help

Contact ASTM Locations FAQ

Policies

Privacy Policy Logo Policy IP Policy Return Policy Copyright & Permissions

Copyright © 1996 - 2025 ASTM. All Rights Reserved. ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA, 19428-2959 USA

Matching Standards Under the Jurisdiction of E10.07 by Status

E668-20 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
-See also WK89437 proposed Revision
E1855-20 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
-See also WK93455 proposed Revision
E265-15(2020) Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
-See also WK89438 proposed Revision
E496-14(2022) Standard Test Method for Measuring Neutron Fluence and Average Energy from ³H(d,n)⁴He Neutron Generators by Radioactivation Techniques
E666-21 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
E720-23 Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E721-22 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
E722-19 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
-See also WK94647 proposed Reapproval
E798-24 Standard Practice for Conducting Irradiations at Accelerator-Based Neutron Sources
E1249-15(2021) Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
-See also WK95696 proposed Revision
E1250-15(2020) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
E1854-19 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
-See also WK86445 proposed Revision
E1894-24 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
E2450-23 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
E3084-17(2022)e1 Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
F448-18 Standard Test Method for Measuring Steady-State Primary Photocurrent
-See also WK87917 proposed Revision
F526-21 Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
F980-16(2024) Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
-See also WK87790 proposed Revision
F1190-24 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
F1192-24 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
F1263-25 Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
-See also WK91442 proposed Revision
F1467-25 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
-See also WK87918 proposed Revision
F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
-See also WK93582 proposed Revision

WK59267 Use of 2N1486 Silicon Bipolar Junction Transistors as Neutron Spectrum Sensors and 1-MeV(Si) Fluence Monitors

E665-94 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
E763-91 Practice for Calculation of Absorbed Dose From Neutron Irradiation by Application of Threshold-Foil Measurement Data (Withdrawn 1997)
E1027-92 Practice for Exposure of Polymeric Materials to Ionizing Radiation (Withdrawn 1996)