WK87790 - Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

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ASTM WK87790

Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

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Ballot overdue. Review will be conducted.

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Developed by Subcommittee: E10.07

Committee: E10

Staff Manager: Stephen Mawn

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Date Initiated: 09-09-2023

Technical Contact: Patrick Griffin

Item: 000

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WK87790 - Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices | ASTM

Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

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Details

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Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Rationale

Details

Work Item Status

Related