E10.07 Jurisdiction Page

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Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices

Matching Standards Under the Jurisdiction of E10.07 by Status

Active 23 matching standards

E265-15(2020) Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32

- See also WK89438 proposed revision

E496-14(2022) Standard Test Method for Measuring Neutron Fluence and Average Energy from ³H(d,n)⁴He Neutron Generators by Radioactivation Techniques
E666-21 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668-20 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

- See also WK89437 proposed revision

- See also WK84440 proposed revision

- See also WK86445 proposed revision

- See also WK81246 proposed revision

- See also WK87917 proposed revision

- See also WK87793 proposed reapproval

- See also WK87790 proposed revision

F1190-24 Standard Guide for Neutron Irradiation of Unbiased Electronic Components

- See also WK87791 proposed revision

F1192-24 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices

- See also WK87792 proposed revision

- See also WK87918 proposed revision

F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

- See also WK87919 proposed revision

Proposed New 1 matching standards

WK59267 Use of 2N1486 Silicon Bipolar Junction Transistors as Neutron Spectrum Sensors and 1-MeV(Si) Fluence Monitors

Withdrawn, Replaced 3 matching standards

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