E10.07 Jurisdiction Page

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Subcommittee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices

Matching Standards Under the Jurisdiction of E10.07 by Status

Active 23 matching standards

E265-15(2020) Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
E496-14(2022) Standard Test Method for Measuring Neutron Fluence and Average Energy from ³H(d,n)⁴He Neutron Generators by Radioactivation Techniques
E666-21 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668-20 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
E720-23 Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E721-22 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
E722-19 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
E798-16 Standard Practice for Conducting Irradiations at Accelerator-Based Neutron Sources
E1249-15(2021) Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
E1250-15(2020) Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
E1854-19 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
E1855-20 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
E1894-18 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
E2450-23 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
E3084-17(2022)e1 Standard Practice for Characterizing Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
F448-18 Standard Test Method for Measuring Steady-State Primary Photocurrent
F526-21 Standard Test Method for Using Calorimeters for Total Dose Measurements in Pulsed Linear Accelerator or Flash X-ray Machines
F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
F1190-18 Standard Guide for Neutron Irradiation of Unbiased Electronic Components
F1192-11(2018) Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
F1263-11(2019) Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
F1467-18 Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
F1892-12(2018) Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices

Withdrawn, Replaced 3 matching standards

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