WK87790 - Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices | ASTM

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Work Item

ASTM WK87790

Revision of F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices

Rationale

Ballot overdue. Review will be conducted.

Details

Developed by Subcommittee: E10.07

Committee: E10

Staff Manager: Stephen Mawn

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