WK84241 - Revision of D8186-18 Standard Test Method for Measurement of Impurities in Graphite by Electrothermal Vaporization Inductively Coupled Plasma Optical Emission Spectrometry (ETV-ICP OES)

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ASTM WK84241

Revision of D8186-18 Standard Test Method for Measurement of Impurities in Graphite by Electrothermal Vaporization Inductively Coupled Plasma Optical Emission Spectrometry (ETV-ICP OES)

Rationale

Minor editorial and technical revision

Details

Developed by Subcommittee: D02.F0

Committee: D02

Staff Manager: Alyson Fick

Work Item Status

Date Initiated: 11-18-2022

Technical Contact: Peter Barth

Item: 007

Ballot: D02 (23-07)

Status: Will Reballot Item

Item: 007

Ballot: D02 (24-05)

Status: Negative Votes Need Resolution

WK84241 - Revision of D8186-18 Standard Test Method for Measurement of Impurities in Graphite by Electrothermal Vaporization Inductively Coupled Plasma Optical Emission Spectrometry (ETV-ICP OES) | ASTM

Revision of D8186-18 Standard Test Method for Measurement of Impurities in Graphite by Electrothermal Vaporization Inductively Coupled Plasma Optical Emission Spectrometry (ETV-ICP OES)

Rationale

Details

Work Item Status

Related

Revision of D8186-18 Standard Test Method for Measurement of Impurities in Graphite by Electrothermal Vaporization Inductively Coupled Plasma Optical Emission Spectrometry (ETV-ICP OES)

Rationale

Details

Work Item Status

Related