Subcommittees and Standards

Standards under the jurisdiction of E42

Each main committee in ASTM International is composed of subcommittees that address specific segments within the general subject area covered by the technical committee. Click on the subcommittee links below to see the title of existing standards for each subcommittee. Then, click on the resulting titles to see the standard's scope, referenced documents, and more.

• E42.02 Terminology
• E42.03 Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
• E42.06 SIMS
• E42.08 Ion Beam Sputtering
• E42.13 Vacuum Technology
• E42.14 STM/AFM
• E42.15 Electron Probe Microanalysis/Electron Microscopy
• E42.90 Executive
• E42.91 Awards
• E42.92 US TAG ISO/TC 201
• E42.94 US TAG ISO/TC 112
• E42.96 US TAG ISO/TC 202