WK91963 - Revision of D8331/D8331M-20 Standard Test Method for Measurement of Film Thickness of Thin-Film Coatings by Non-Destructive Means Using Ruggedized Optical Interference

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ASTM WK91963

Revision of D8331/D8331M-20 Standard Test Method for Measurement of Film Thickness of Thin-Film Coatings by Non-Destructive Means Using Ruggedized Optical Interference

Rationale

Routine review

Details

Developed by Subcommittee: D01.53

Committee: D01

Staff Manager: Jennifer Tursi

Work Item Status

Date Initiated: 08-13-2024

Technical Contact: Brian Lilla

Item: 005

Ballot: D01 (25-01)

Status: In Balloting

WK91963 - Revision of D8331/D8331M-20 Standard Test Method for Measurement of Film Thickness of Thin-Film Coatings by Non-Destructive Means Using Ruggedized Optical Interference | ASTM

Revision of D8331/D8331M-20 Standard Test Method for Measurement of Film Thickness of Thin-Film Coatings by Non-Destructive Means Using Ruggedized Optical Interference

Rationale

Details

Work Item Status

Related

Revision of D8331/D8331M-20 Standard Test Method for Measurement of Film Thickness of Thin-Film Coatings by Non-Destructive Means Using Ruggedized Optical Interference

Rationale

Details

Work Item Status

Related