Revision of F1467-18 Standard Guide for Use of an X-Ray Tester (˜10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Rationale
Normal review of standard transferred from F01.11.
WK87918 - Revision of F1467-18 Standard Guide for Use of an X-Ray Tester (˜10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits | ASTM
