WK87918 - Revision of F1467-18 Standard Guide for Use of an X-Ray Tester (˜10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

Work Item

ASTM WK87918

Revision of F1467-18 Standard Guide for Use of an X-Ray Tester (˜10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

Normal review of standard transferred from F01.11.

Developed by Subcommittee: E10.07

Committee: E10

Staff Manager: Stephen Mawn

Date Initiated: 09-19-2023

Technical Contact: Patrick Griffin

Item: 000

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