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Subcommittee E42.14 on S…
Subcommittee E42.14 on STM/AFM
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Matching Standards Under the Jurisdiction of E42.14 by Status
Active
1 matching standards
E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
Proposed New
0 matching standards
Withdrawn, Replaced
4 matching standards
E1813 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
E2530 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)
E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps (Withdrawn 2015)
Subcommittee E42.14 on STM/AFM | ASTM
