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E1162-11(2019) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)
E1438-11(2019) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)
E1634-11(2019) Standard Guide for Performing Sputter Crater Depth Measurements
E1635-06(2019) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)
E1880-12(2020) Standard Practice for Tissue Cryosection Analysis with SIMS
E1881-12(2020) Standard Guide for Cell Culture Analysis with SIMS
E2426-10(2019) Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS
E1505-92(2001) Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards (Withdrawn 2010)
E2695 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)
E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)
