E42.03 Jurisdiction Page

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Subcommittee E42.03 on Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Matching Standards Under the Jurisdiction of E42.03 by Status

Active 12 matching standards

E983-19 Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
E984-12(2020) Standard Guide for Identifying Chemical Effects and Matrix Effects in Auger Electron Spectroscopy
E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
E1016-07(2020) Standard Guide for Literature Describing Properties of Electrostatic Electron Spectrometers
E1078-14(2020) Standard Guide for Specimen Preparation and Mounting in Surface Analysis
E1127-08(2015) Standard Guide for Depth Profiling in Auger Electron Spectroscopy
E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
E1829-14(2020) Standard Guide for Handling Specimens Prior to Surface Analysis
E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments

Withdrawn, Replaced 3 matching standards

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