Subcommittee E42.08 on Ion Beam Sputtering | ASTM

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Subcommittee E42.08 on I…

Subcommittee E42.08 on Ion Beam Sputtering

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Matching Standards Under the Jurisdiction of E42.08 by Status

E684-04 Standard Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces (Withdrawn 2012)
E1577 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis (Withdrawn 2020)
E1577-11 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis (Withdrawn 2020)
E1636 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function (Withdrawn 2019)
E1636-10 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function (Withdrawn 2019)