Get Involved / Technical Committees / Committee E42 / Subcommittee E42.06 Standards

      Subcommittee E42.06 on SIMS


      Showing results 1-8 of 8 matching ACTIVE standards under the jurisdiction of E42.06     E42 Home

      E1162-11(2019) Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

      E1438-11(2019) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

      E1504-11(2019) Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)

      E1634-11(2019) Standard Guide for Performing Sputter Crater Depth Measurements

      E1635-06(2019) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

      E1880-12(2020) Standard Practice for Tissue Cryosection Analysis with SIMS

      E1881-12(2020) Standard Guide for Cell Culture Analysis with SIMS

      E2426-10(2019) Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS

      0 matching Proposed New Standards under the jurisdiction of E42.06     E42 Home

      Showing Results 1-2 of 2 matching WITHDRAWN standards under the jurisdiction of E42.06     E42 Home

      E1505-92(2001) Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards (Withdrawn 2010)

      E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)