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ASTM International is providing no-cost public access to important ASTM standards used in the production and testing of personal protective equipment. Find out more.
ASTM Committee E42 on Surface Analysis was formed in 1976. E42 meets twice a year, usually in June and October prior to the annual AVS/ASSD meeting on Surface Analysis or the International AVS Symposium, with approximately 20 members attending the one-day technical meetings. The Committee, with a current membership of about 75, has jurisdiction of more than 27 standards, published in the Annual Book of ASTM Standards, Volume 03.06. E42 has 9 technical subcommittees that maintain jurisdiction over these standards. These standards have and continue to play a preeminent role in all aspects of surface analysis, including Auger electron spectroscopy (AES), X-ray or ultraviolet induced electron emission spectroscopy (XPS/UPS), ion beam sputtering, scanning ion microbeam [space] mass analysis and ion microscopy (SIMS), and scanning tunneling and atomic force microscopy (STM/AFM). E-42 members have developed the concepts and approaches that have helped significantly improve quantitative surface analysis over the past 25 years.