Subcommittee E42.14 on STM/AFM


    Showing results 1-3 of 3 matching ACTIVE standards under the jurisdiction of E42.14     E42 Home

    E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy

    E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

    E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

    0 matching Proposed New Standards under the jurisdiction of E42.14     E42 Home