Subcommittees and Standards

Showing results 1-3 of 3 matching ACTIVE standards under the jurisdiction of E42.14     E42 Home

E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy

E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

E2530-06 Standard Practice for Calibrating the Z-Magnification of an Atomic Force Microscope at Subnanometer Displacement Levels Using Si(111) Monatomic Steps

0 matching Proposed New Standards under the jurisdiction of E42.14     E42 Home

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