Subcommittees and Standards

Showing results 1-3 of 3 matching ACTIVE standards under the jurisdiction of E42.08     E42 Home

E684-04 Standard Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces

E1577-04 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis

E1636-04 Standard Practice for Analytically Describing Sputter-Depth-Profile Interface Data by an Extended Logistic Function

Showing results 1-1 of 1 matching Proposed New Standards under the jurisdiction of E42.08     E42 Home

WK19049 Consistence and Reproducibility of Sputter Rate Measurements

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