Subcommittee E42.08 on Ion Beam Sputtering


    Showing results 1-2 of 2 matching ACTIVE standards under the jurisdiction of E42.08     E42 Home

    E1577-11 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis

    E1636-10 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function

    0 matching Proposed New Standards under the jurisdiction of E42.08     E42 Home

    0 matching WITHDRAWN standards under the jurisdiction of E42.08     E42 Home