Subcommittees and Standards

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E1577-11 Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis

E1636-10 Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function

Showing results 1-1 of 1 matching Proposed New Standards under the jurisdiction of E42.08     E42 Home

WK19049 New Test Method for Consistence and Reproducibility of Sputter Rate Measurements

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