Subcommittees and Standards

Showing results 1-9 of 9 matching ACTIVE standards under the jurisdiction of E42.06     E42 Home

E1162-06 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

E1504-06 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)

E1505-92(2001) Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards
    See also WK17308 proposed revision

E1634-02(2007) Standard Guide for Performing Sputter Crater Depth Measurements

E1635-06 Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

E1880-06 Standard Practice for Tissue Cryosection Analysis with SIMS

E1881-06 Standard Guide for Cell Culture Analysis with SIMS

E2426-05 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS

Showing results 1-1 of 1 matching Proposed New Standards under the jurisdiction of E42.06     E42 Home

WK13188 Guide for Standard Guide for interpretation of mass spectral data acquired with ToF-SIMS

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