Subcommittee E42.06 on SIMS


    Showing results 1-9 of 9 matching ACTIVE standards under the jurisdiction of E42.06     E42 Home

    E1162-11 Standard Practice for Reporting Sputter Depth Profile Data in Secondary Ion Mass Spectrometry (SIMS)

    E1438-11 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

    E1504-11 Standard Practice for Reporting Mass Spectral Data in Secondary Ion Mass Spectrometry (SIMS)

    E1634-11 Standard Guide for Performing Sputter Crater Depth Measurements

    E1635-06(2011) Standard Practice for Reporting Imaging Data in Secondary Ion Mass Spectrometry (SIMS)

    E1880-12 Standard Practice for Tissue Cryosection Analysis with SIMS

    E1881-12 Standard Guide for Cell Culture Analysis with SIMS

    E2426-10 Standard Practice for Pulse Counting System Dead Time Determination by Measuring Isotopic Ratios with SIMS

    E2695-09 Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy

    0 matching Proposed New Standards under the jurisdiction of E42.06     E42 Home

    E1505-92(2001) Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards (Withdrawn 2010)