Technical Committees / Committee E10 /
Committee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices
Showing results 1-14 of 14 matching ACTIVE standards under the jurisdiction of E10.07 E10 Home
E265-07(2013) Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32 See also WK36250 proposed revision
E496-09 Standard Test Method for Measuring Neutron Fluence and Average Energy from 3H(d,n)4He Neutron Generators by Radioactivation Techniques 1 See also WK42470 proposed revision
E665-94 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)
E666-09 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation See also WK40962 proposed revision
E668-13 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices See also WK33713 proposed revision
E720-11 Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics
E721-11 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics
E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics See also WK40703 proposed revision
E1249-10 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
E1250-10 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
E1854-07 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts See also WK38236 proposed revision
E1855-10 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
E1894-08 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources See also WK36272 proposed revision See also WK42442 proposed revision
E2450-11 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments
F526-11 Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests
Showing results 1-1 of 1 matching Proposed New Standards under the jurisdiction of E10.07 E10 Home
WK33685 New Practice for Characterizing Charged-Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)
