Technical Committees / Committee E10 /


Committee E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices


Subcommittees and Standards

Showing results 1-14 of 14 matching ACTIVE standards under the jurisdiction of E10.07     E10 Home

E265-07(2013) Standard Test Method for Measuring Reaction Rates and Fast-Neutron Fluences by Radioactivation of Sulfur-32
    See also WK36250 proposed revision

E496-09 Standard Test Method for Measuring Neutron Fluence and Average Energy from 3H(d,n)4He Neutron Generators by Radioactivation Techniques 1

E665-94 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)

E666-09 Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation
    See also WK40962 proposed revision

E668-13 Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
    See also WK33713 proposed revision

E720-11 Standard Guide for Selection and Use of Neutron Sensors for Determining Neutron Spectra Employed in Radiation-Hardness Testing of Electronics

E721-11 Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics

E722-09e1 Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
    See also WK40703 proposed revision

E1249-10 Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources

E1250-10 Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices

E1854-07 Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
    See also WK38236 proposed revision

E1855-10 Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

E1894-08 Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
    See also WK36272 proposed revision

E2450-11 Standard Practice for Application of CaF2(Mn) Thermoluminescence Dosimeters in Mixed Neutron-Photon Environments

F526-11 Standard Test Method for Measuring Dose for Use in Linear Accelerator Pulsed Radiation Effects Tests


Showing results 1-1 of 1 matching Proposed New Standards under the jurisdiction of E10.07     E10 Home

WK33685 New Practice for Characterizing Charged-Particle Irradiations of Materials in Terms of Non-Ionizing Energy Loss (NIEL)

E665-94 Practice for Using Absorbed Dose Versus Depth in Materials to Verify the X-ray Output of Flash X-ray Machines (Withdrawn 2000)



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