Work Item
ASTM WK84872

New Test Method for Measurement and Quantification of Reflectance and Fluorescence Factor using Semiconductor Light Emitters

1. Scope

1.1 This Test Method applies to the measurement and quantification of specimen object color
exhibiting fluorescence excited by near-ultraviolet and visible radiation caused by semi-conductor
light emitters resulting in re-emission of energy at longer wavelengths.
1.2 This Test Method describes the measurement requirements, calibration procedures, and material
standards required for obtaining bi-spectral data to measure and compute the fluorescence
component of the total radiance factor.
1.3 This Test Method describes the requirements for a spectrofluorometer to obtain and output
instrument-independent, bi-spectral, photometric data.
1.4 This Test Method is appropriate for the measurement and quantification of ultraviolet activated
fluorescence materials, visible activated fluorescence materials, fluorescence retroreflective
materials, and conventional object-colored materials, where colorimetric properties are obtained by
spectrophotometric assessment.
1.5 This method’s data output conforms to requirements specified by the CIE, ASTM, and other
international standards, which describes the visible fluorescence spectral radiance factor relative to
the total radiance.
1.6 The scope of this Test Method is limited to object-color measurement under reflection using the
bi-directional geometry 0o:45oc conforming to CIE recommendations.
1.7 The values stated in SI units are to be regarded as standard. No other units of measurement are
included in this standard.


Fluorescence; spectrofluorometer; fluorescence materials


Develop a new standard for measuring fluorescence with a sphere geometry.

The title and scope are in draft form and are under development within this ASTM Committee.


Developed by Subcommittee: E12.05

Committee: E12

Staff Manager: Jamie Huffnagle

Work Item Status

Date Initiated: 01-18-2023

Technical Contact: Charles Lategano

Item: 000