STP Published: 1980
STP712-EB

Lifetime Factors in Silicon

Editor(s): R. D. Westbrook

A comprehensive review published for the purpose of furthering standards development relating to carrier lifetime measurement, interpretation, and control.

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Details
Developed by Committee: F01
Pages: 258
DOI: 10.1520/STP712-EB
ISBN-EB: 978-0-8031-4780-5
ISBN-13: 978-0-8031-0390-0