STP Published: 1973
STP536-EB

Progress in Flaw Growth and Fracture Toughness Testing

Editor(s): J. Kaufman, J. Swedlow, H. Corten, J. Srawley, R. Heyer, E. Wessel, G. Irwin

Table of Contents

J. Kaufman

C. Ho, O. Buck, H. Marcus

G. Lindsey

G. Sendeckyj

M. Schroedl, C. Smith

M. Wnuk

R. Schmidt, P. Paris

R. Rice, R. Stephens

V. Trebules, R. Roberts, R. Hertzberg

J. Barsom

W. Harrigan, D. Dull, L. Raymond

E. Imhof, J. Barsom

R. Bucci, B. Greene, P. Paris

J. Rice, P. Paris, J. Merkle

J. Begley, J. Landes

J. Merkle

C. Buchalet, T. Mager

D. Shockey, D. Curran

J. Kaufman, P. Schilling

A. Sullivan, J. Stoop, C. Freed

D. Wang

F. Nelson, J. Kaufman

R. Judy, R. Goode

R. Hertzberg, J. Manson, W. Wu

P. Randall, J. Merkle

H. Okamura, K. Watanabe, T. Takano

J. Bjeletich, T. Morton

J. Kiefner, W. Maxey, R. Eiber, A. Duffy

R. Derby

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Details
Developed by Committee: E08
Pages: 486
DOI: 10.1520/STP536-EB
ISBN-EB: 978-0-8031-8151-9
ISBN-13: 978-0-8031-6660-8