Editor(s): W. Wiebe
The Symposium on Applications of Electron Microfractography to Materials Research was given at the Seventy-third Annual Meeting of the American Society for Testing and Materials held in Toronto, Ont., Canada, 2126 June 1970. The Sponsor of this symposium was ASTM Subcommittee II on Fractography and Associated Microstructures of ASTM Committee E24 on Fracture Testing of Metals. W. Wiebe, National Research Council of Canada, presided as symposium chairman.
AJ Brothers, M Hill, MT Parker, WA Spitzig, W Wiebe, UE Wolff
FL Carr, D Biehler, A Connolly, R Dragen, J Faller, O Johari, R Morais, MT Parker, RH Sailors
K Farrell, JO Stiegler
GA Wilber, JH Bucher