SYMPOSIA PAPER Published: 01 January 1964
STP45944S

X-ray Optics in Electron Microanalysis

Source

The electron microanalyzer produces the ideal source for X-ray focusing spectrometry. The cross divergence present in X-ray fluorescence units is absent, and the divergence in the plane of the spectrometer can be used to great advantage. Features of Johansson and Johann optics are discussed in detail as well as spectrometer designs capable of fulfilling these two conditions. The monochromators have been treated from both ideally imperfect and ideally perfect crystal theory. Various types of crystals have also been considered as to their perfection, dispersion, and intensity.

Author Information

Ogilvie, Robert
Massachusetts Institute of Technology, Cambridge, Mass.
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Details
Developed by Committee: E13
Pages: 17–23
DOI: 10.1520/STP45944S
ISBN-EB: 978-0-8031-6749-0
ISBN-13: 978-0-8031-6603-5