SYMPOSIA PAPER Published: 01 January 1958
STP45045S

High Temperature Strain Gage Evaluator

Source

Data contained in the published literature on high-temperature strain gages are frequently inadequate for immediate use. In most cases, the information available is based either on a different gage type or on the same gage bonded to a different material. Two alternative procedures can be followed to overcome this obstacle: acceptance of an enlarged uncertainty figure or performance of a separate test. Testing is usually imperative and urgent. At the Bell Aircraft Corporation, a quick cantilever-test-method of handling strain gage problems has provided usable information. However, lacking clear-cut separation of variables, such test results are more properly a system check and do not provide basic information. They are the offspring of the jury rig. Due to the pressures of the missile programs, we at Bell were forced until recently to content ourselves with the jury rig. Now, we hope to complete a strain gage analyzer worthy of its name. While the prime justification for this analyzer is high-temperature work, its basic elements can be used in a variety of environments.

Author Information

Martina, C., K.
Applications Engineer, Instrumentation Section, Bell Aircraft Corp., Buffalo, N. Y.
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: E28
Pages: 131–132
DOI: 10.1520/STP45045S
ISBN-EB: 978-0-8031-5950-1
ISBN-13: 978-0-8031-6104-7