SYMPOSIA PAPER Published: 01 January 1965

Transient Radiation Effects in Semiconductor Devices


Transistors in conventional simple circuits were exposed to bursts of x-radiation from a 600 Kv flash x-ray machine. Analyses of the circuit responses are given in terms of electrical equivalent circuits. Electrical and radiation tests are compared.

Author Information

Crowe, J., W.
North American Aviation, Inc., Canoga Park, Calif.
Sauer, A., J.
North American Aviation, Inc., Canoga Park, Calif.
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Developed by Committee: E10
Pages: 61–99
DOI: 10.1520/STP44607S
ISBN-EB: 978-0-8031-6009-5
ISBN-13: 978-0-8031-6163-4