SYMPOSIA PAPER Published: 01 January 1963
STP44488S

An Instrument for the Contactless Measurement of Minority Carrier Lifetime

Source

Minority carrier lifetime indicates the purity of semiconductor materials. Whereas resistivity is a measure of the concentration of impurities with an energy level near either the valence or conduction band, lifetime is affected most by impurities that have an energy level near the middle of the band gap. Thus lifetime data indicate the presence of impurities and imperfections other than those indicated by resistivity data (1).

Author Information

Currin, C.
Dow Corning Corp., Hemlock, Mich.
Smith, F.
Dow Corning Corp., Midland, Mich.
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: F01
Pages: 131–138
DOI: 10.1520/STP44488S
ISBN-EB: 978-0-8031-6211-2
ISBN-13: 978-0-8031-6139-9