SYMPOSIA PAPER Published: 01 January 1943
STP43916S

An Exposure Meter for X-Ray Radiography

Source

An X-ray exposure meter has been developed for use with a 220-kv. X-ray radiographic installation at the Naval Research Laboratory. For given brands of film and intensifying screens, the meter may be calibrated to indicate the exposure times required for any desired film blackening. The dependence of this calibration on kilovoltage, specimen material, and filter technique has been investigated. In routine radiography, it is possible to obtain satisfactory results with a single calibration curve, at all voltages between 125-kv. and 200-kv., for any specimen material, and for filtered as well as unfiltered radiation. The receiving element of the exposure meter is a Geiger-Muller counter designed to permit accurate intensity determinations in a few seconds, with the measured beam of radiation limited to a pencil of X-rays, 1/4 in. in diameter. The use of a small aperture on the counter permits the scanning of portions of castings of nonuniform thickness to determine an optimum kilovoltage and suitable filter technique for radiographing. Since the counter is placed close to the film position, the meter indications are independent of variations in the source-to-film distance.

Author Information

Friedman, Herbert
Division of Physical Metallurgy, Naval Research Laboratory, Anacostia Station, Washington, D. C
Christenson, Arthur, L.
Division of Physical Metallurgy, Naval Research Laboratory, Anacostia Station, Washington, D. C
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: E07
Pages: 197–207
DOI: 10.1520/STP43916S
ISBN-EB: 978-0-8031-5896-2
ISBN-13: 978-0-8031-6050-7