SYMPOSIA PAPER Published: 01 January 1962
STP43686S

X-Ray Diffraction in the Electron Probe Microanalyzer

Source

The electron probe microanalyzer is shown to be a useful X-ray diffraction instrument which produces a particular type of diffraction pattern known as Kossel lines. The means by which the crystal orientation and the lattice constant can be obtained from Kossel lines is also demonstrated.

Author Information

Heise, B., H.
Linde Co., Tonowanda Laboratories, Tonowanda, N. Y.
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Details
Developed by Committee: E04
Pages: 182–189
DOI: 10.1520/STP43686S
ISBN-EB: 978-0-8031-5971-6
ISBN-13: 978-0-8031-6125-2