SYMPOSIA PAPER Published: 01 January 1963
STP41266S

Electron Probe Microanalysis: A New Method of Calculating Absorption Correction

Source

In electron probe microanalysis, the measured X-ray intensities are proportional to the concentrations as corrected for secondary effects, namely self-absorption and fluorescence.

Author Information

Philibert, Jean
IRSID, SaintGermain-en-Laye, France
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Details
Developed by Committee: E04
Pages: 3–5
DOI: 10.1520/STP41266S
ISBN-EB: 978-0-8031-5983-9
ISBN-13: 978-0-8031-6137-5