SYMPOSIA PAPER Published: 01 January 1970

Advances in X-ray Metallography


X-ray metallography, as defined for this review, consists of the application of X-rays to the microstructural characterization of solids. Basic crystal structure analysis is excluded, though the identification of phases whose crystal structures are known is not: the subject is briefly reviewed, using examples taken mostly from recently published works. The principles and typical applications of X-ray diffraction topography are emphasized. Other methods to which specific references are made include microradiography, macrostrain measurement, Kossel pattern analysis, and applications of long wavelength X-ray analysis.

Author Information

Newkirk, JB
University of Denver, Denver, Colo.
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Developed by Committee: E04
Pages: 152–182
DOI: 10.1520/STP32080S
ISBN-EB: 978-0-8031-4591-7
ISBN-13: 978-0-8031-0747-2