SYMPOSIA PAPER Published: 01 January 1990

Sensitive n Measurements Using a Single Beam


We present a sensitive single beam technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far-field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance curve (Z-scan). Employing this technique a sensitivity of better than λ/300 wavefront distortion is achieved in n2 measurements of BaF2 using picosecond visible laser pulses.

Author Information

Sheik-Bahae, M
Said, AA
Wei, TH
Hagan, DJ
Van Stryland, EW
Soileau, MJ
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Developed by Committee: E13
Pages: 126–135
DOI: 10.1520/STP26481S
ISBN-EB: 978-0-8031-5157-4
ISBN-13: 978-0-8031-4478-1