SYMPOSIA PAPER Published: 01 January 1990

Dynamic Modulus Measurements and Materials Research


Dynamic modulus measurements are of interest in materials research not only as a source of data on elastic behavior, but also for the insight they provide into structure-property relationships in general. A description is given of a vibrating-reed apparatus which has proved highly adaptable for studies of the elastic and damping behavior of thin-film and other thin-layer electronic materials. Results are reported for amorphous and crystalline ferromagnetic materials, for the high-Tc superconducting oxide Y1Ba2Cu3O7-x, and for thin films of aluminum and silicon monoxide, to illustrate the important role which the dynamic modulus can play as a tool in materials research.

Author Information

Berry, BS
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Developed by Committee: E28
Pages: 3–17
DOI: 10.1520/STP24612S
ISBN-EB: 978-0-8031-5111-6
ISBN-13: 978-0-8031-1291-9