SYMPOSIA PAPER Published: 01 January 1989

Development of an Instrumented Device to Measure Fixture-induced Bending in Pin-loaded Specimen Trains


Mechanical testing of various types is conducted using pinned clevis fixtures to transmit test loads to a range of specimen configurations. To ensure reliable repeatable results, fixture-induced load distribution variations must be kept to a minimum. This paper describes a simple, inexpensive, instrumented device and data analysis technique for measuring fixture-induced bending (that is, transverse nonuniformity of load application) of compact type [C(T)] specimen fixtures. Finite-element analysis was performed to illustrate the importance of uniform load distribution. The instrumented device may be used for other sizes or configurations of pin-loaded trains after consideration of appropriate dimensional modifications to the instrumented device.

Author Information

Scavone, DW
General Electric Co., Knolls Atomic Power Laboratory, Schenectady, NY
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Developed by Committee: E28
Pages: 160–173
DOI: 10.1520/STP24019S
ISBN-EB: 978-0-8031-5086-7
ISBN-13: 978-0-8031-1251-3