SYMPOSIA PAPER Published: 01 January 1986
STP17414S

Computation of Stable Crack Growth Using the -Integral

Source

Crack growth of almost 8 mm in a standard C(T) specimen is computed in ten steps by tracking a J-resistance curve for 7475-T7351 aluminum. Some discussion is presented as to why the far-field J is preferable to near-field quantities for this procedure. The analysis did not track the companion force-displacement curve.

Author Information

Carifo, JE
Martin Marietta Aerospace, Pittsburgh, MD
Swedlow, JL
Martin Marietta Aerospace, Pittsburgh, MD
Cho, C-W
ALCOA Laboratories, Alcoa Center, PA
Price: $25.00
Contact Sales
Related
Reprints and Permissions
Reprints and copyright permissions can be requested through the
Copyright Clearance Center
Details
Developed by Committee: E08
Pages: 503–511
DOI: 10.1520/STP17414S
ISBN-EB: 978-0-8031-4972-4
ISBN-13: 978-0-8031-0472-3