STP Published: 2023
STP1647-EB

Radiation Embrittlement Trend Curves and Equations and Their Use for RPV Integrity Evaluations

Editor(s): William L. Server, Milan Brumovský, Mark Kirk

Table of Contents

Maksym Zarazovskii, Volodymyr Revka, Liudmyla Chyrko

Naoki Soneda, Mark Kirk

Randy K. Nanstad, Nathan Almirall, Peter Wells, William L. Server, Mikhail A. Sokolov, Elliot J. Long, G. Robert Odette

Marjorie Erickson, Mark Kirk

Oliva Tuck, Caroline Pyke, Paul Styman, Susan Ortner

Paul Styman, Katharine Chivers, Elliot Long, Susan Ortner

J. Brian Hall, Ben E. Mays, Derek A. Simpson

Patrick Todeschini, William Jourdain, Kevin Jeuland, Nicolas Jardin, Christophe Dal Bianco, Jean-Paul Massoud

J. Brian Hall, Gordon Z. Hall, Elliot J. Long

Boris Margolin, Elena Yurchenko

Jenny Roudén, Johan Blomström, Pål Efsing, Martin Berglund

Yoshinori Hashimoto, Akiyoshi Nomoto, Ryoichi Saeki, Kenichi Nakashima, Kenji Nishida, Mark Kirk

Mark Kirk, Diego Ferreño Blanco, Jose Adolfo Sainz-Aja Guerra

Tommi Seppänen, Sebastian Lindqvist, Pentti Arffman, Petteri Lappalainen

Rachid Chaouadi, Inge Uytdenhouwen, Jean-Louis Puzzolante

Ferenc Gillemot, Dávid Cinger, Ildikó Szenthe, Márta Horváth, Szilvia Móritz

Gyeong-Geun Lee, Min-Chul Kim, Joonho Lee, Bong-Sang Lee

Hieronymus Hein, Johannes May, Vanessa Lind-Tueysuez

Milan Brumovský

Johan Blomström, Jenny Roudén, Pål Efsing

Daniel S. Widrevitz, Jeffrey C. Poehler

Antonio Ballesteros, Marta Colomer, Marta Serrano

Milan Brumovský

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Details
DOI: 10.1520/STP1647-EB
ISBN-EB: 978-0-8031-7742-0
ISBN-13: 978-0-8031-7741-3