SYMPOSIA PAPER Published: 14 December 2018
STP160820170039

Co-60 Filter Box Optimization

Source

The measurement of photon dose in pure gamma-ray and mixed (neutron/gamma) field environments relies heavily on calibration of thermoluminescent dosimeters (TLDs) in cobalt-60 (Co-60) gamma irradiation environments. One of the principal means of reducing the gamma dose measurement uncertainty in Sandia National Laboratories’ reactor environments is careful calibration of the CaF2:Mn TLDs used in the test environment. One issue that arises is that Co-60 gamma fields used for calibration universally have a low energy photon component. The scattered photons that make up the low energy photon component are a principal source of measurement error for the TLD calibration. ASTM E1249, Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources, describes a method that utilizes photon spectrum filter boxes to enclose devices under test that can reduce the measurement error during TLD calibration as well as during normal radiation testing of electronic components in the gamma field. Using a silicon sensor representative of a CMOS-7 technology, a series of calculations was performed for single-layer, two-layer, and three-layer filters to identify a filter box that improves the silicon dose-to-kerma ratio (that is, the filter reduces the low energy photon component in the Co-60 radiation field) in the sensor over the current filter box design. The results of the parameter study in this paper will be used to plan experimental studies in the Co-60 gamma fields used for calibration.

Author Information

DePriest, K.
Applied Nuclear Technologies, Sandia National Laboratories, Albuquerque, NM, US
Vehar, David
Applied Nuclear Technologies, Sandia National Laboratories, Albuquerque, NM, US
Laub, Thomas
Radiation Effects Theory Dept., Sandia National Laboratories, Albuquerque, NM, US
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Details
Developed by Committee: E10
Pages: 590–599
DOI: 10.1520/STP160820170039
ISBN-EB: 978-0-8031-7662-1
ISBN-13: 978-0-8031-7661-4