STP Published: 2018
STP1603-EB

International Review of Nuclear Reactor Pressure Vessel Surveillance Programs

Editor(s): William L. Server, Milan Brumovský

Technical experts from 11 countries share their knowledge and experience working with nuclear reactor pressure vessel surveillance programs in this special publication.

Topics discussed include actual surveillance capsule testing and associated results; applications to evaluating the irradiated material toughness results; and identification of problem areas identified from conducting international surveillance programs.

The 24 peer-reviewed papers are divided into five key categories:

– Bases for RPV Surveillance Programs
– Neutron Dosimetry for Surveillance Programs
– National Surveillance Programs
– Surveillance for Long-Term Operation
– Experience from Surveillance Programs

Sponsored by ASTM International Committee E10 on Nuclear Technology and Applications, this publication features papers that were presented at the June 2016 Workshop on Nuclear Reactor Pressure Vessel Surveillance Programs held in Chicago, IL.

Table of Contents

William L. Server

Mark Kirk, Robert Hardies, Matthew Gordon

Milan Brumovský

Randy K. Nanstad, Mikhail A. Sokolov, Susan R. Ortner, Paul D. Styman

Greg A. Fischer

Milan Brumovský, Milan Marek

J. Brian Hall, Elliot J. Long

Matthew J. DeVan

Patrick Todeschini, Louison Pineau, Benoît Courtois, Yang Shen, Malika El Gharbaoui, Nicolas Jardin

Takatoshi Hirota, Takashi Hirano, Masayuki Uchihashi, Tetsuya Toyoda, Shinichi Takamoto, Naoki Soneda

Pal Efsing, Peter Ekström

Antonio Ballesteros Avila, Ignacio Marcelles Ramirez

Bong-Sang Lee, Ji-Hyun Yoon, Min-Chul Kim, Choon-Sung Yoo, Byoung-Chul Kim

Robert Gérard, Rachid Chaouadi

Hieronymus Hein, Johannes May

Keith Wilford, Susan Ortner, Katherine Chivers

Milan Brumovský

Anna Chernobaeva, Dmitry Erak, Vyacheslav Kochkin

William L. Server, Timothy C. Hardin, Nathan A. Palm

Antonio Ballesteros Avila

Elliot J. Long, J. Brian Hall

Milan Brumovský

Mark Kirk

Hans-Werner Viehrig, Eberhard Altstadt, Mario Houska, Matti Valo

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Details
Developed by Committee: E10
Pages: 468
DOI: 10.1520/STP1603-EB
ISBN-EB: 978-0-8031-7652-2
ISBN-13: 978-0-8031-7651-5