STP Published: 2017

Fatigue and Fracture Test Planning, Test Data Acquisitions and Analysis

Editor(s): Gary Harlow, Pete McKeighan, Kamran Nikbin, Zhigang Wei

Get 20 peer-reviewed papers that will help you not only understand but also prevent fatigue and fracture. Access this new and diverse information regarding test planning, data acquisition and analysis, arranged into the following four sections:

1. Testing Planning and Performance Characterization
2. Data Acquisition, Quality Assurance, and Analysis
3. Modeling/Simulation, Interpretation, and Correlation
4. Verification, Validation, and Applications

As materials are increasingly being stretched to their limits by extreme conditions of temperature, stress, corrosive environments, and longer service life cycles, there is a rising demand to improve testing. Critical to several industries, this research aims to accelerate the revision of the existing standards and the development of new standards.

Table of Contents

Matthias Bruchhausen, Kevin Mottershead, Caitlin Hurley, Thomas Métais, Román Cicero, Marc Vankeerberghen, Jean-Christophe Le Roux

Hong Wang, Jy-An John Wang

Xijia Wu, Guangchun Quan, Clayton Sloss

Martin Bjurman, Björn Forssgren, Pål Efsing

Noushin Torabian, Véronique Favier, Saeed Ziaei-Rad, Justin Dirrenberger, Frédéric Adamski, Nicolas Ranc

Raghu V. Prakash, Mathew John, Deepika Sudevan, Andrea Gianneo, Michele Carboni

Gongyao Wang, Kimberly Maciejewski, Mark James

Stephen M. Graham

Michael Wächter, Alfons Esderts

Bruce A. Young, Richard C. Rice, Steven R. Thompson, Doug Hall

Hong-Tae Kang, Xiao Wu, Abolhassan K. Khosrovaneh, Zhen Li

Xian-Kui Zhu

Hao Wu, Zheng Zhong

Grzegorz Socha

Shizhu Xing, Pingsha Dong

Jifa Mei, Pingsha Dong

Hoda Eskandari, Ho Sung Kim

Limin Luo, Jason Hamilton, Zhigang Wei, Robert Rebandt

Wenjing Wang, Jinyi Bai, Sichun Li, Hongwei Zhao, Weiguang Sun

Mark T. Seitz, Jason D. Hamilton, Richard K. Voltenburg, Limin Luo, Zhigang Wei, Robert G. Rebandt

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Developed by Committee: E08
Pages: 410
DOI: 10.1520/STP1598-EB
ISBN-EB: 978-0-8031-7640-9
ISBN-13: 978-0-8031-7639-3