STP Published: 2011
STP1529-EB

Zirconium in the Nuclear Industry: 16th International Symposium

Editor(s): Pierre Barberis

Forty-two peer-reviewed papers cover the entire spectrum of zirconium metallurgy, from basic metallurgy to accidental conditions and transport, through fabrication, creep and growth, and corrosion and hydriding.

Sections cover:
• Kroll Award Papers on explosion cladding; zirconium alloys in light water reactors; and much more.
• Schemel Award Paper on photoelectrochemical investigation of radiation enhanced shadow corrosion phenomenon
• Basic Metallurgy
• Fabrication and Mechanical Properties
• Hydriding—Hydrogen Effect
• Corrosion—Oxide Layer Characterization
• In Pile Behavior
• Creep and Deformation
• Failure Mechanisms and Transients

Table of Contents

John G. Banker

David G. Franklin

V. N. Shishov

B. A. Cheadle

Young-Jin Kim, Raul Rebak, Yang-Pi Lin, Daniel Lutz, Douglas C. Crawford, Aylin Kucuk, Bo Cheng

J. K. Chakravartty, R. Kapoor, A. Sarkar, S. Banerjee

Maria Ivermark, Joseph Robson, Michael Preuss

Javier Romero, Michael Preuss, João Quinta da Fonseca, Robert J. Comstock, Mats Dahlbäck, Lars Hallstadius

P. Mosbrucker, M. R. Daymond, R. A. Holt

A. Jardy, F. Leclerc, M. Revil-Baudard, P. Guerin, H. Combeau, V. Rebeyrolle

A. Gaillac, C. Lemaignan, P. Barberis

Mathieu Priser, Martin Rautenberg, Jean-Marc Cloué, Philippe Pilvin, Xavier Feaugas, Dominique Poquillon

W. Li, R. A. Holt, S. Tracy

G. A. Bickel, M. Griffiths, A. Douchant, S. Douglas, O. T. Woo, A. Buyers

N. Saibaba, S. K. Jha, S. Tonpe, Kumar Vaibhaw, V. Deshmukh, S. V. Ramana Rao, K. V. Mani Krishna, S. Neogy, D. Srivastava, G. K. Dey, R. V. Kulkarni, B. B. Rath, E. Ramadasan, S. A. Anantharaman

H. M. Nordin, A. J. Elliot, S. G. Bergin

K. Une, K. Sakamoto, M. Aomi, J. Matsunaga, Y. Etoh, I. Takagi, S. Miyamura, T. Kobayashi, K. Ito

Toshio Kubo, Hiroaki Muta, Shinsuke Yamanaka, Masayoshi Uno, Keizo Ogata

M. Y. Yao, J. H. Wang, J. C. Peng, B. X. Zhou, Q. Li

Kimberly B. Colas, Arthur T. Motta, Mark R. Daymond, Matthew Kerr, Jonathan D. Almer

S. Valance, J. Bertsch, A. M. Alam

C. Coleman, V. Grigoriev, V. Inozemtsev, V. Markelov, M. Roth, V. Makarevicius, Y. S. Kim, Kanwar Liaqat Ali, J. K. Chakravartty, R. Mizrahi, R. Lalgudi

Micro Grosse

Pia Tejland, Mattias Thuvander, Hans-Olof Andrén, Sorina Ciurea, Thomas Andersson, Mats Dahlbäck, Lars Hallstadius

B. X. Zhou, J. C. Peng, M. Y. Yao, Q. Li, S. Xia, C. X. Du, G. Xu

M. Preuss, P. Frankel, S. Lozano-Perez, D. Hudson, E. Polatidis, N. Ni, J. Wei, C. English, S. Storer, K. B. Chong, M. Fitzpatrick, P. Wang, J. Smith, C. Grovenor, G. Smith, J. Sykes, B. Cottis, S. Lyon, L. Hallstadius, R. J. Comstock, A. Ambard, M. Blat-Yrieix

A. Ly, A. Ambard, M. Blat-Yrieix, L. Legras, P. Frankel, M. Preuss, C. Curfs, G. Parry, Y. Bréchet

F. Garzarolli, B. Cox, P. Rudling

S. Valizadeh, G. Ledergerber, S. Abolhassani, D. Jädernäs, M. Dahlbäck, E. V. Mader, G. Zhou, J. Wright, L. Hallstadius

P. Vizcaíno, A. V. Flores, P. B. Bozzano, A. D. Banchik, R. A. Versaci, R. O. Ríos

A. M. Garde, R. J. Comstock, G. Pan, R. Baranwal, L. Hallstadius, T. Cook, F. Carrera

V. Chabretou, P. B. Hoffmann, S. Trapp-Pritsching, G. Garner, P. Barberis, V. Rebeyrolle, J. J. Vermoyal

G. P. Kobylyansky, A. E. Novoselov, A. V. Obukhov, Z. E. Ostrovsky, V. N. Shishov, M. M. Peregud, V. A. Markelov

John Paul Foster, Rita Baranwal

Margaret A. McGrath, Suresh Yagnik

S. Carassou, C. Duguay, P. Yvon, F. Rozenblum, J. M. Cloué, V. Chabretou, C. Bernaudat, B. Levasseur, A. Maurice, P. Bouffioux, K. Audic

B. Bourdiliau, F. Onimus, C. Cappelaere, V. Pivetaud, P. Bouffioux, V. Chabretou, A. Miquet

Sheikh T. Mahmood, Paul E. Cantonwine, Yang-Pi Lin, Douglas C. Crawford, E. V. Mader, K. Edsinger

C. Duriez, S. Guilbert, A. Stern, C. Grandjean, L. Bělovský, J. Desquines

Masafumi Nakatsuka, Suresh Yagnik

Kan Sakamoto, Masafumi Nakatsuka, Toru Higuchi

V. Grigoriev, R. Jakobsson, D. Schrire, G. Ledergerber, T. Sugiyama, F. Nagase, T. Fuketa, L. Hallstadius, S. Valizadeh

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Developed by Committee: B10
Pages: 851
DOI: 10.1520/STP1529-EB
ISBN-EB: 978-0-8031-7515-0
ISBN-13: 978-0-8031-8893-8