STP Published: 2009
STP1508-EB

Seventh International ASTM∕ESIS Symposium on Fatigue and Fracture Mechanics (36th ASTM National Symposium on Fatigue and Fracture Mechanics)

Editor(s): Richard W. Neu, Kim R. W. Wallin, Steven R. Thompson

Forty-two peer reviewed papers present the latest research in:

• Residual stress effects on fatigue and fracture

• Multiscale and physics-based approaches

• Reactor components and materials

• Fatigue crack growth

• Predicting the effects of elevated temperatures and environment

• Fatigue and fracture of specific components, joining methods, surface treatments, and coatings.

Each of these areas presents their own challenges to the development and application of engineering approaches to predict the structural integrity and remaining life of systems.

Table of Contents

James A. Joyce, Xiaosheng Gao

Juan R. Donoso, Katherine Vasquez, John D. Landes

Enrico Lucon, Marc Scibetta

Xian-Kui Zhu, Brian N. Leis, James A. Joyce

Xin Wang

Patrick J. Golden, Dennis Buchanan, Sam Naboulsi

Kristina Langer, Scott VanHoogen, Jeffery Hoover

H. Leitner, B. Oberwinkler, H. -P. Gaenser, M. Stoschka

Shankar Mall, J. L. Ng, E. Madhi

Minwoo Kang, Kentaro Irisa, Yuuta Aono, Hiroshi Noguchi

Len Reid, Joy Ransom

Sami Heinilä, Timo Björk, Gary Marquis

Dale L. Ball

Y. Yamada, J. C. Newman, J. C. Newman

John J. Ruschau, James C. Newman

Stephen M. Graham, Richard Stanley

Yoichi Yamashita, Fumiyoshi Minami

Michael R. Hill, John E. VanDalen

C. J. Aird, S. Hadidi-Moud, C. E. Truman, D. J. Smith

M. Marx, W. Schaef, M. Welsch, H. Vehoff

Jeremy E. Schaffer

Min Liao, Kyle Chisholm, Mario Mahendran

J. Toribio, B. González, J. C. Matos, F. J. Ayaso

Masato Yamamoto, Takayuki Kitamura, Takashi Ogata

M. Dadfarnia, P. Sofronis, B. P. Somerday, I. M. Robertson

M. Scibetta, J. Schuurmans, E. Lucon

Xinglong Zhao, David Lidbury, João Quinta da Fonseca, Andrew Sherry

B. W. Leitch, S. St. Lawrence

Koji Ikematsu, Takuhiro Mishima, Minwoo Kang, Yuuta Aono, Hiroshi Noguchi

M. Carboni, S. Beretta, M. Madia

Aaron T. Nardi, Stephen L. Smith

V. N. Shlyannikov, B. V. Ilchenko, N. V. Boychenko

H. Koeberl, G. Winter, H. Leitner, W. Eichlseder

V. N. Shlyannikov, B. V. Ilchenko, R. R. Yarullin

Raghu V. Prakash, Akash Bagla

Justus Medgenberg, Thomas Ummenhofer

Dwight A. Burford, Bryan M. Tweedy, Christian A. Widener

Allison Nolting, Leon M. Cheng, James Huang

A. E. Nolting, P. R. Underhill, D. L. DuQuesnay

Richard D. Widdle, Lee C. Firth, Paul W. Reed

A. Lamik, H. Leitner, W. Eichlseder, F. Riemelmoser

C. N. David, M. A. Athanasiou, K. G. Anthymidis, P. K. Gotsis

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Details
Developed by Committee: E08
Pages: 605
DOI: 10.1520/STP1508-EB
ISBN-EB: 978-0-8031-6999-9
ISBN-13: 978-0-8031-3416-4